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Trace-Based Post-Silicon Validation for VLSI Circuits 252

By: Liu Springer International Publishing 2014Edition: 1ISBN: 978-3-319-00533-1Online resources: Click here to access online
Item type Current location Collection Call number Status Date due Barcode Item holds
E-Books E-Books Central Library, KARE, Krishnankoil Campus
Electronics and Communication Engineering - Available EBK1126
Total holds: 0

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