Alfred C L <br/><br/>
Design-for-Test for Digital ICs and Embedded Core Systems 

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 - 349 
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<br/><br/><br/>English 
<br/><br/><label>ISBN: </label>2000001334 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronics and CommunicationIntegrated Circuits