TY  - BOOK
AU  - Zjajo
TI  - Stochastic Process Variation in Deep-Submicron CMOS
SN  - 978-94-007-7781-1
PY  - 2014///
PB  - Springer Netherlands
N1  - Fulltext
UR  - http://link.springer.com/10.1007/978-94-007-7781-1
ER  -