| 000 | 00475nam a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 201210s9999||||xx |||||||||||||| ||und|| | ||
| 020 | _a978-94-007-7663-0 | ||
| 100 |
_aFranco _947767 |
||
| 245 | 0 |
_aReliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications _p47 |
|
| 250 | _a1 | ||
| 264 |
_bSpringer Netherlands _c2014 _dMonograph |
||
| 500 | _aFulltext | ||
| 546 | _aENG | ||
| 856 | _uhttp://link.springer.com/10.1007/978-94-007-7663-0 | ||
| 942 | _cEBK | ||
| 999 |
_c29668 _d29668 |
||